Publications
Found 5 results
Author Keyword Title [ Type] Year Filters: Author is Béla Vancsics [Clear All Filters]
Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density. Proceedings of the 9th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'16); The 11th International Workshop on Mutation Analysis (MUTATION'16). :174-179.
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2016. Supporting Software Product Line Testing by Optimizing Code Configuration Coverage. Proceedings of the 8th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'15); 10th Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART'15). :1-7.
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2015. Supporting Software Product Line Testing by Optimizing Code Configuration Coverage. Proceedings of the 8th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'15); 10th Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART'15). :1-7.
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2015. Test Suite Evaluation using Code Coverage Based Metrics. Proceedings of the 14th Symposium on Programming Languages and Software Tools (SPLST'15). :46-60.
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2015. Analysis of Static and Dynamic Test-to-code Traceability Information. Acta Cybernetica. 23:903-919.
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2018.