Publications

Found 5 results
Author Keyword Title [ Type(Desc)] Year
Filters: Author is Béla Vancsics  [Clear All Filters]
Conference Paper
Tengeri D, Vidács L, Beszédes Á, Jász J, Balogh G, Vancsics B, Gyimóthy T.  2016.  Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density. Proceedings of the 9th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'16); The 11th International Workshop on Mutation Analysis (MUTATION'16). :174-179.
Vidács L, Horváth F, Mihalicza J, Vancsics B, Beszédes Á.  2015.  Supporting Software Product Line Testing by Optimizing Code Configuration Coverage. Proceedings of the 8th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'15); 10th Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART'15). :1-7.
Vidács L, Horváth F, Mihalicza J, Vancsics B, Beszédes Á.  2015.  Supporting Software Product Line Testing by Optimizing Code Configuration Coverage. Proceedings of the 8th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'15); 10th Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART'15). :1-7.
Horváth F, Vancsics B, Vidács L, Beszédes Á, Tengeri D, Gergely T, Gyimóthy T.  2015.  Test Suite Evaluation using Code Coverage Based Metrics. Proceedings of the 14th Symposium on Programming Languages and Software Tools (SPLST'15). :46-60.