Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density
| Title | Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density |
| Publication Type | Conference Paper |
| Year of Publication | 2016 |
| Authors | Tengeri D, Vidács L, Beszédes Á, Jász J, Balogh G, Vancsics B, Gyimóthy T |
| Conference Name | Proceedings of the 9th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'16); The 11th International Workshop on Mutation Analysis (MUTATION'16) |
| Pagination | 174-179 |
| Date Published | April |
| Publisher | IEEE Computer Society |
| DOI | 10.1109/ICSTW.2016.25 |
Kiemelt