Publications
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[ Author] Keyword Title Type Year Filters: Author is Tengeri, Dávid [Clear All Filters]
Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density. Proceedings of the 9th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'16); The 11th International Workshop on Mutation Analysis (MUTATION'16). :174-179.
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2016.