Found 1 resultsAuthor Keyword Title Type [ Year]
Filters: Author is Jász, Judit [Clear All Filters]
Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density. Proceedings of the 9th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'16); The 11th International Workshop on Mutation Analysis (MUTATION'16). :174-179.. 2016.