Publications

Found 29 results
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Surgery
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
Surface reconstruction
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
stability
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
source code parsing
Ferenc R, Gustafsson J, Müller L, Paakki J.  2001.  Recognizing Design Patterns in C++ programs with the integration of Columbus and Maisa. Proceedings of the 7th Symposium on Programming Languages and Software Tools (SPLST 2001). :58–70.
serial section warping
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
robust point correspondence
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
Robustness
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
reverse engineering
Ferenc R, Gustafsson J, Müller L, Paakki J.  2001.  Recognizing Design Patterns in C++ programs with the integration of Columbus and Maisa. Proceedings of the 7th Symposium on Programming Languages and Software Tools (SPLST 2001). :58–70.
reliability measure
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
registration transformation
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
preoperative facial range scans
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
postoperative facial range scans
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
object-oriented design
Ferenc R, Gustafsson J, Müller L, Paakki J.  2001.  Recognizing Design Patterns in C++ programs with the integration of Columbus and Maisa. Proceedings of the 7th Symposium on Programming Languages and Software Tools (SPLST 2001). :58–70.
movement sensitivity
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
medical image processing
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
medical applications
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
image registration
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
Image reconstruction
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
Image matching
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
Helium
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
design patterns
Ferenc R, Gustafsson J, Müller L, Paakki J.  2001.  Recognizing Design Patterns in C++ programs with the integration of Columbus and Maisa. Proceedings of the 7th Symposium on Programming Languages and Software Tools (SPLST 2001). :58–70.
CSM
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
Cost function
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.
C++
Ferenc R, Gustafsson J, Müller L, Paakki J.  2001.  Recognizing Design Patterns in C++ programs with the integration of Columbus and Maisa. Proceedings of the 7th Symposium on Programming Languages and Software Tools (SPLST 2001). :58–70.
Biomedical measurements
Guest E., Berry E., Baldock R.A, Fidrich M., Smith M.A.  2001.  Robust point correspondence applied to two- and three-dimensional image registration. IEEE Transactions on Pattern Analysis and Machine Intelligence. 23:165-179.

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